In early April, we concluded a productive four-day sequence of X-ray Raman scattering (XRS) experiments, specifically investigating the effects of radiation on artists' paints during the XRS analysis. This effort is a vital element of the EU-funded project ARIAH, made feasible with the assistance and support provided by the SSRL synchrotron facility. Throughout the experiments, the MSCA fellow, Rafaella Georgiou along with PhD student Sophia Vogelsang from the University of Wisconsin-Madison, SSRL post-doctoral fellow Oscar Paredes, and 15-2 beamline scientist Dimosthenis Sokaras, acquired carbon K-edge data on a series of model paints, defining the proper parameters for a safer XRS analysis.
Special thanks to the beamline scientist Dimosthenis Sokaras and post-doctoral fellow Oscar Paredes Mellone, for their valuable help!
